1. Records of the 1999 IEEE International Workshop on memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA
پدیدآورنده : edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology; in cooperation with the IEEE Solid-State Circuits Society
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4I44
1999
